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SPIE Proceedings [SPIE Nondestructive Evaluation Techniques for Aging Infrastructure and Manufacturing - Scottsdale, AZ (Tuesday 3 December 1996)] Nondestructive Evaluation for Process Control in Manufacturing - CT-assisted metrology for manufacturing applications
Yancey, Robert N., Eliasen, Dennis S., Gibson, Roosevelt, Dzugan, Robert, Bossi, Richard H., Moran, TomVolume:
2948
Year:
1996
Language:
english
DOI:
10.1117/12.259203
File:
PDF, 683 KB
english, 1996