SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Polarization: Measurement, Analysis, and Remote Sensing - Polarization analysis system for very rough surfaces
Vogtmeier, Gereon, Scholl, Bernhard, Schmitt, Hans J., Goldstein, Dennis H., Chipman, Russell A.Volume:
3121
Year:
1997
Language:
english
DOI:
10.1117/12.278960
File:
PDF, 773 KB
english, 1997