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SPIE Proceedings [SPIE ISMA '97 International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 23 June 1997)] Microelectronic Packaging and Laser Processing - Development of the IBIC (ion-beam-induced charge) technique for IC failure analysis
Osipowicz, Thomas, Sanchez, J. L., Watt, Frank, Kolachina, S., Ong, V. K. S., Chan, Daniel S. H., Phang, J. C. H., Swee, Yong Khim, Zheng, HongYu, Chen, Ray T.Volume:
3184
Year:
1997
DOI:
10.1117/12.280557
File:
PDF, 1.13 MB
1997