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SPIE Proceedings [SPIE Photonics East (ISAM, VVDC, IEMB) - Boston, MA (Sunday 1 November 1998)] Chemical Microsensors and Applications - Microfabricated voltammetric sensors for trace metal analysis
Fiaccabrino, Giovanni C., van der Wal, Peter D., de Rooij, Nico F., Koudelka-Hep, Milena, Tercier, Marylou, Belmont-Hebert, Cecile, Buffle, Jacques, Confalonieri, Fabio, Riccardi, Guiliano, Graziotin,Volume:
3539
Year:
1998
Language:
english
DOI:
10.1117/12.333744
File:
PDF, 185 KB
english, 1998