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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Developments in X-Ray Tomography II - Microtomography of elastomers for tire manufacture
Dunsmuir, John H., Dias, A. J., Peiffer, D. G., Kolb, R., Jones, G., Bonse, UlrichVolume:
3772
Year:
1999
Language:
english
DOI:
10.1117/12.363742
File:
PDF, 2.64 MB
english, 1999