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SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Neural network based automated texture classification system
Rughooputh, Harry C. S., Rughooputh, Soonil D. D. V., Kinser, Jason M., Tobin, Jr., Kenneth W.Volume:
3966
Year:
2000
Language:
english
DOI:
10.1117/12.380089
File:
PDF, 1.21 MB
english, 2000