SPIE Proceedings [SPIE Symposium on Integrated Optoelectronics - San Jose, CA (Thursday 20 January 2000)] Optoelectronic Interconnects VII; Photonics Packaging and Integration II - Transverse modal characterization of VCSELs based on intensity measurement
Xue, Xin, Kirk, Andrew G., Feldman, Michael R., Li, Richard L., Matkin, W. Brian, Tang, SuningVolume:
3952
Year:
2000
Language:
english
DOI:
10.1117/12.384393
File:
PDF, 358 KB
english, 2000