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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Space Systems Engineering and Optical Alignment Mechanisms - Error modeling of multi-baseline optical truss: part II. Applications to SIM metrology truss field dependent error
Zhang, Liwei D., Peterson, Lee D., Guyer, Robert C., Milman, Mark H., Korechoff, Robert E.Volume:
5528
Year:
2004
Language:
english
DOI:
10.1117/12.557138
File:
PDF, 357 KB
english, 2004