SPIE Proceedings [SPIE OE/LASE '92 - Los Angeles, CA (Sunday 19 January 1992)] Scanning Probe Microscopies - New imaging mode in atomic-force microscopy based on the error signal
Putman, Constant A., van der Werf, Kees O., de Grooth, Bart G., van Hulst, Niko F., Greve, Jan, Hansma, Paul K., Manne, SrinivasVolume:
1639
Year:
1992
Language:
english
DOI:
10.1117/12.58191
File:
PDF, 691 KB
english, 1992