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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - A long standoff profilometer for surface inspection in adverse environments based on conoscopic holography
Enguita, Jose M., Osten, Wolfgang, Gorecki, Christophe, Alvarez, Ignacio, Fraga, Cesar, Novak, Erik L., Marina, Jorge, Fernandez, Yolanda, Sirat, GabrielVolume:
5856
Year:
2005
Language:
english
DOI:
10.1117/12.612259
File:
PDF, 607 KB
english, 2005