SPIE Proceedings [SPIE SPIE Optics + Photonics - San Diego, California, USA (Sunday 13 August 2006)] Developments in X-Ray Tomography V - High-resolution x-ray tomography using laboratory sources
Tkachuk, Andrei, Bonse, Ulrich, Feser, Michael, Cui, Hongtao, Duewer, Fred, Chang, Hauyee, Yun, WenbingVolume:
6318
Year:
2006
Language:
english
DOI:
10.1117/12.682383
File:
PDF, 549 KB
english, 2006