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SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic technology, and Artificial Intelligence - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence - Fast RLS Fourier analyzers for sinusoidal signals in noise and application
Xiao, Yegui, Fang, Jiancheng, Wang, Zhongyu, Ma, Liying, Ikuta, AkiraVolume:
6357
Year:
2006
Language:
english
DOI:
10.1117/12.716991
File:
PDF, 240 KB
english, 2006