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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, California (Sunday 17 January 2010)] Wavelet Applications in Industrial Processing VII - Real-time wavelet based blur estimation on cell BE platform

Lukic, Nemanja, Truchetet, Frédéric, Laligant, Olivier, Platiša, Ljiljana, Pižurica, Aleksandra, Philips, Wilfried, Temerinac, Miodrag
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Volume:
7535
Year:
2010
Language:
english
DOI:
10.1117/12.839501
File:
PDF, 1.15 MB
english, 2010
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