SPIE Proceedings [SPIE Soft X-Rays Optics and Technology - Berlin, Germany (Tuesday 8 December 1987)] Soft X-Ray Optics and Technology - X-UV Optics in near-normal incidence realised at the "Institut d'Optique"
Chauvineau, J. P., Marioge, J. P., Bridou, F., Tissot, G., Valiergue, L., Bonino, B., Koch, E., Schmahl, Guenther A.Volume:
733
Year:
1986
Language:
english
DOI:
10.1117/12.964925
File:
PDF, 303 KB
english, 1986