SPIE Proceedings [SPIE Electronic Imaging Device Engineering - Munich, Federal Republic of Germany (Monday 21 June 1993)] Computer Vision for Industry - Automatic surface inspection and classification systems
Stiefvater, H., Braggins, Donald W.Volume:
1989
Year:
1993
Language:
english
DOI:
10.1117/12.164870
File:
PDF, 65 KB
english, 1993