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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Interferometry VI: Applications - Profilometry by white light autocorrelation function sampling
Sandoz, Patrick, Pryputniewicz, Ryszard J., Brown, Gordon M., Jueptner, Werner P. O.Volume:
2004
Year:
1994
Language:
english
DOI:
10.1117/12.172610
File:
PDF, 393 KB
english, 1994