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SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] Near-Field Optics - Fluorescence scanning near-field optical microscopy in reflection
Jalocha, Alain, Moers, Marco H. P., van Hulst, Niko F., Paesler, Michael A., Moyer, Patrick J.Volume:
2535
Year:
1995
Language:
english
DOI:
10.1117/12.218694
File:
PDF, 913 KB
english, 1995