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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Optical diagnostics of thermoplastic dielectric and semiconductor material in thin layers
Voronov, Sergey A., Katkovskiy, Oleg B., Neduzhiy, Sergey A., Solovyov, Alexander V., Statnikov, Yuriy G., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
2648
Year:
1995
Language:
english
DOI:
10.1117/12.226130
File:
PDF, 138 KB
english, 1995