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SPIE Proceedings [SPIE Second International Conference on Optical Information Processing - St. Petersburg, Russia (Monday 17 June 1996)] Second International Conference on Optical Information Processing - Noise degradation and fault tolerance in annealed binary-phase hologram interconnections
Smith, Patrick J., Samus, Sergei, Hossack, William J., Vass, David G., Alferov, Zhores I., Gulyaev, Yuri V., Pape, Dennis R.Volume:
2969
Year:
1996
Language:
english
DOI:
10.1117/12.262601
File:
PDF, 354 KB
english, 1996