SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Laser Interferometry VIII: Techniques and Analysis - Double shear speckle interferometry for curvature measurement
Ganesan, A. R., Murukeshan, Vadakke M., Meinlschmidt, Peter, Sirohi, Rajpal S., Kujawinska, Malgorzata, Pryputniewicz, Ryszard J., Takeda, MitsuoVolume:
2860
Year:
1996
Language:
english
DOI:
10.1117/12.276305
File:
PDF, 358 KB
english, 1996