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SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII - Calibration and upgrades of the XMM vertical EUV/X test facility: FOCAL X
Tock, Jean P., Collette, Jean-Paul, Stockman, Yvan, Siegmund, Oswald H. W., Gummin, Mark A.Volume:
3114
Year:
1997
Language:
english
DOI:
10.1117/12.278904
File:
PDF, 557 KB
english, 1997