SPIE Proceedings [SPIE Intelligent Systems & Advanced Manufacturing - Pittsburgh, PA (Tuesday 14 October 1997)] Machine Vision Applications, Architectures, and Systems Integration VI - Train-by-show in color-based assembly and packaging inspection
McConnell, Robert K., Solomon, Susan S., Batchelor, Bruce G., Miller, John W. V.Volume:
3205
Year:
1997
Language:
english
DOI:
10.1117/12.285579
File:
PDF, 1.45 MB
english, 1997