SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Ellipsometric probing of metallic mirrors with modified surfaces
Poperenko, Leonid V., Voitsenya, Vladimir S., Vinnichenko, M. V., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
3359
Year:
1998
Language:
english
DOI:
10.1117/12.306202
File:
PDF, 236 KB
english, 1998