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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Polarization: Measurement, Analysis, and Remote Sensing II - Calibration procedures for a two-modular generalized ellipsometer
Jellison, Jr., Gerald E., Modine, Frank A., Chen, Chi, Goldstein, Dennis H., Chenault, David B.Volume:
3754
Year:
1999
Language:
english
DOI:
10.1117/12.366357
File:
PDF, 338 KB
english, 1999