![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology - Software SKIPSM implementation for template matching
Waltz, Frederick M., Miller, John W. V., Harding, Kevin G., Miller, John W. V., Batchelor, Bruce G.Volume:
4189
Year:
2001
Language:
english
DOI:
10.1117/12.417210
File:
PDF, 50 KB
english, 2001