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SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design - Absolute optical path difference measurement with angstrom accuracy over ranges of millimeters
Krieg, Lukas M., Klaver, Rene G., Braat, Joseph J. M., Osten, Wolfgang, Jueptner, Werner P. O., Kujawinska, MalgorzataVolume:
4398
Year:
2001
Language:
english
DOI:
10.1117/12.445541
File:
PDF, 802 KB
english, 2001