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SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Recent Developments in Traceable Dimensional Measurements - Development and traceability of a multifunctional microscope
Chen, Wen-Jong, Lee, Chih-Kung, Lua, Shui-Shong, Chang, Yu-Jena, Chang, Yu-Chiaa, Chang, Chi-Yuana, Shiue, Shuen-Chen, Lee, Shu-Sheng, Liou, Huay-Chung, Decker, Jennifer E., Brown, NicholasVolume:
4401
Year:
2001
Language:
english
DOI:
10.1117/12.445622
File:
PDF, 706 KB
english, 2001