SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II - Implementation of multiview 3D display system using volume holographic optical element
Cho, Byung-Chul, Gu, Jung-Sik, Kim, Eun-Soo, Harding, Kevin G., Miller, John W. V.Volume:
4567
Year:
2002
Language:
english
DOI:
10.1117/12.455260
File:
PDF, 889 KB
english, 2002