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SPIE Proceedings [SPIE Astronomical Telescopes and Instrumentation - Waikoloa, HI (Thursday 22 August 2002)] High-Contrast Imaging for Exo-Planet Detection - Achromatic four-quadrant phase mask using the dispersion of form birefringence
Mawet, Dimitri, Lenaerts, C., Moreau, Vincent, Renotte, Yvon L. M., Rouan, Daniel, Surdej, Jean, Schultz, Alfred B., Lyon, Richard G.Volume:
4860
Year:
2003
Language:
english
DOI:
10.1117/12.457918
File:
PDF, 215 KB
english, 2003