SPIE Proceedings [SPIE OPTO Ireland - Galway, Ireland (Thursday 5 September 2002)] Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision - Using quantitative statistics for the construction of machine vision systems
Thacker, Neil A., Shearer, Andrew, Murtagh, Fionn D., Mahon, James, Whelan, Paul F.Volume:
4877
Year:
2003
Language:
english
DOI:
10.1117/12.468491
File:
PDF, 285 KB
english, 2003