SPIE Proceedings [SPIE Electronic Imaging 2003 - Santa...

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SPIE Proceedings [SPIE Electronic Imaging 2003 - Santa Clara, CA (Monday 20 January 2003)] Machine Vision Applications in Industrial Inspection XI - Temperature mapping in heat treatment process with a standard color-video camera by means of image processing

Zauner, Gerald, Heim, Daniel, Hendorfer, Gunther, Niel, Kurt, Hunt, Martin A., Price, Jeffery R.
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Volume:
5011
Year:
2003
Language:
english
DOI:
10.1117/12.477505
File:
PDF, 254 KB
english, 2003
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