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SPIE Proceedings [SPIE Integrated Optoelectronics Devices - San Jose, CA (Saturday 25 January 2003)] Quantum Sensing: Evolution and Revolution from Past to Future - Noninvasive electrical characterization of semiconductor at bulk and interfaces
Vanderhaghen, Regis, Kasouit, Samir, Drevillon, Bernard, Chu, Virginia, Conde, Joao, Kim, Hyunjong, Kleider, Jean Paul, Razeghi, Manijeh, Brown, Gail J.Volume:
4999
Year:
2003
Language:
english
DOI:
10.1117/12.482505
File:
PDF, 218 KB
english, 2003