SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Evaluation of object's roughness and spherical illumination in grating moire and speckle interferometry
Rodriguez-Vera, Ramon, Martinez, Alejandrina, Puga, Hugo J., Rayas, J. A., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. HerbertVolume:
4900
Year:
2002
Language:
english
DOI:
10.1117/12.484456
File:
PDF, 645 KB
english, 2002