SPIE Proceedings [SPIE Optical Science and Technology,...

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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications - Performance of an adaptive u-focusing Kirkpatrick-Baez system for high-pressure studies at the Advanced Photon Source

Signorato, Riccardo, Khounsary, Ali M., Dinger, Udo, Hausermann, Daniel, Somayazulu, Maddury, Ota, Kazuya, Carre, Jean-Francois
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Volume:
5193
Year:
2003
Language:
english
DOI:
10.1117/12.520827
File:
PDF, 1.31 MB
english, 2003
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