SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Interferometry XII: Techniques and Analysis - Interferometric measurement of a multiparallel-surface transparent object by a new class of wavelength tuning algorithms
Hibino, Kenichi, Creath, Katherine, Schmit, Joanna, Burke, Jan, Hanayama, Ryohei, Oreb, Bozenko F.Volume:
5531
Year:
2004
Language:
english
DOI:
10.1117/12.555804
File:
PDF, 206 KB
english, 2004