SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Light-Emitting Diode Materials and Devices - Quality measurement of cutting and grinding surfaces based on image
Liu, Xianli, Yu, Gang, Chen, Chuangtian, Wang, Yujing, Li, Yufu, Lee, Changhee, Yan, Fugang, Zhao, YanlingVolume:
5632
Year:
2004
Language:
english
DOI:
10.1117/12.577041
File:
PDF, 477 KB
english, 2004