SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Machine Vision Applications in Industrial Inspection XIII - Square pulse thermography system design considerations for detection of voids inside of the material with different properties and finite differences

Price, Jeffery R., Traxler, Gerhard, Scheerer, Michael, Meriaudeau, Fabrice, Steiger, Christoph
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Volume:
5679
Year:
2005
Language:
english
DOI:
10.1117/12.585744
File:
PDF, 334 KB
english, 2005
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