SPIE Proceedings [SPIE SPIE Third International Symposium on Fluctuations and Noise - Austin, TX (Monday 23 May 2005)] Noise in Devices and Circuits III - Different noise mechanisms in high-k dielectric gate stacks (Invited Paper)
Celik-Butler, Zeynep, Balandin, Alexander A., Danneville, Francois, Deen, M. Jamal, Fleetwood, Daniel M.Volume:
5844
Year:
2005
Language:
english
DOI:
10.1117/12.611250
File:
PDF, 227 KB
english, 2005