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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Phase evaluation using interference of polychromatic light and colorimetric analysis
Novak, Pavel, Osten, Wolfgang, Gorecki, Christophe, Novak, Jiri, Miks, Antonin, Novak, Erik L.Volume:
5856
Year:
2005
Language:
english
DOI:
10.1117/12.612016
File:
PDF, 232 KB
english, 2005