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SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Optical Manufacturing and Testing VI - A new approach to predict computer controlled polishing results
Pitschke, Elmar, Stahl, H. Philip, Schinhaerl, Markus, Geiss, Andreas, Sperber, Peter, Rascher, Rolf, Stamp, Richard, Smith, Lyndon, Smith, MelvynVolume:
5869
Year:
2005
Language:
english
DOI:
10.1117/12.616780
File:
PDF, 222 KB
english, 2005