SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose, CA (Sunday 15 January 2006)] Optical Security and Counterfeit Deterrence Techniques VI - Overt security features through digital printing

Hampden-Smith, Mark, van Renesse, Rudolf L., Haubrich, Scott, Kornbrekke, Ralph, Shah, Jainisha, Bhatia, Rimple, Hardman, Ned, Einhorn, Rich
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Volume:
6075
Year:
2006
Language:
english
DOI:
10.1117/12.641882
File:
PDF, 1.85 MB
english, 2006
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