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SPIE Proceedings [SPIE Defense and Security Symposium - Orlando (Kissimmee), FL (Monday 17 April 2006)] Thermosense XXVIII - Thermography and neural networks for SRAM voltage stress prediction
Hsieh, Sheng-Jen, Miles, Jonathan J., Peacock, G. Raymond, Sharma, Kartik, Knettel, Kathryn M.Volume:
6205
Year:
2006
Language:
english
DOI:
10.1117/12.663726
File:
PDF, 385 KB
english, 2006