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SPIE Proceedings [SPIE 2nd international Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - A blind deconvolution method in a LCSM system
Yang, Li, Huang, Lin, Tao, Cunkan, Wen, Shangming, Chen, Yaolong, Hu, Maohai, Kley, Ernst-BernhardVolume:
6149
Year:
2005
Language:
english
DOI:
10.1117/12.674306
File:
PDF, 289 KB
english, 2005