SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007 - Beijing, China (Sunday 9 September 2007)] International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing - Image based measurement for the center position error of micro-sphere in micro-target
Wang, Ting, Zhou, Liwei, Qiu, Zurong, Wang, Jinjiang, Wang, BingzhenVolume:
6624
Year:
2007
Language:
english
DOI:
10.1117/12.791097
File:
PDF, 367 KB
english, 2007