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SPIE Proceedings [SPIE Fourth International Symposium on Precision Mechanical Measurements - Anhui, China (Monday 25 August 2008)] Fourth International Symposium on Precision Mechanical Measurements - Determining sample size in binary measurement system
Zhao, Yan, Fei, Yetai, Fan, Kuang-Chao, He, Zhen, Blunt, Liam, Lu, Rongsheng, Jiang, Xiangqian, Cao, Yanlong, Zhang, HongyuVolume:
7130
Year:
2008
Language:
english
DOI:
10.1117/12.819773
File:
PDF, 246 KB
english, 2008