SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Applications of Digital Image Processing XXXIV - Wavefront aberration function from hard contact lenses obtained with two different techniques
Tescher, Andrew G., Cruz Félix, Angel S., López-Olazagasti, Estela, Sánchez-de-la-Llave, David, Ramírez-Zavaleta, Gustavo, Tepichín-Rodríguez, EduardoVolume:
8135
Year:
2011
Language:
english
DOI:
10.1117/12.892919
File:
PDF, 4.40 MB
english, 2011