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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Infrared Remote Sensing and Instrumentation XIX - Digital scanner infrared focal plane technology
Ortiz, M. A., Strojnik, Marija, Paez, Gonzalo, Malone, N. R., Harris, M., Shin, J., Byers, S., Price, D., Vampola, J.Volume:
8154
Year:
2011
Language:
english
DOI:
10.1117/12.897342
File:
PDF, 2.40 MB
english, 2011