SPIE Proceedings [SPIE 1983 Technical Symposium East -...

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SPIE Proceedings [SPIE 1983 Technical Symposium East - Arlington (Tuesday 5 April 1983)] Applications of Optical Metrology: Techniques and Measurements II - Characterization And Calibration Of An Optical Fiber Bandwidth Measurement System For Field Utilization

Chipman, John D., Prescott, Ken, Lee, Jar J.
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Volume:
416
Year:
1983
Language:
english
DOI:
10.1117/12.935924
File:
PDF, 535 KB
english, 1983
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