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SPIE Proceedings [SPIE 29th Annual Technical Symposium - San Diego (Tuesday 20 August 1985)] Automatic Inspection and Measurement - Stress Sensor
Hodor, J. R., Decker, Jr., H. J., Barney, J., Green, J. H., Brook, Richard A., Chen, Michael J. W.Volume:
557
Year:
1985
Language:
english
DOI:
10.1117/12.966253
File:
PDF, 10.57 MB
english, 1985