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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Applications and Science of Neural Networks, Fuzzy Systems, and Evolutionary Computation - On-line measurement and accuracy analysis for parts using neural networks
Xiong, Yingen, Zhang, Guangzhao, Bosacchi, Bruno, Fogel, David B., Bezdek, James C.Volume:
3455
Year:
1998
Language:
english
DOI:
10.1117/12.326725
File:
PDF, 842 KB
english, 1998